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Cluster Secondary Ion Mass Spectrometry: Principles and Applications
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Cluster Secondary Ion Mass Spectrometry: Principles and Applications (Hardback)

£98.50
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Synopsis

This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.

Science & MathematicsChemistryAnalytical chemistryChromatographyScience & MathematicsChemistryAnalytical chemistryMagnetic resonanceScience & MathematicsChemistryAnalytical chemistrySpectrum analysis, spectrochemistry, mass spectrometry Publisher: John Wiley and Sons Ltd Publication Date: 28/06/2013 ISBN-13: 9780470886052  Details: Type: Hardback Format: Books
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Christine M. Mahoney, PhD, is a recognized expert and leader in the field of Secondary Ion Mass Spectrometry (SIMS). Throughout her career, she has focused primarily on the application of SIMS to molecular targets, and has played a significant role in the development of cluster SIMS for polymer depth profiling applications. She received her PhD in analytical chemistry from SUNY Buffalo in 1993. She spent the following eight years at the National Institute of Standards and Technology (NIST), where much of her molecular depth profiling work was performed. Christine is currently employed as a senior research scientist at the Environmental Molecular Sciences Laboratory (EMSL) at Pacific Northwest National Laboratory (PNNL), where she continues to lead research in the field of SIMS.

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