Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

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Paperback Published on: 08/06/2013
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Publisher information

  • Publisher: Springer-Verlag New York Inc.
  • ISBN: 9781475790290
  • Number of pages: 454
  • Dimensions: 229 x 152 mm
  • Languages: English

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