Non-Fiction, Science & Maths, Popular Science, Engineering
Scanning Probe Microscopy

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

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Paperback Published on: 23/11/2010
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Publisher information

  • Publisher: Springer-Verlag New York Inc.
  • ISBN: 9781441923066
  • Number of pages: 282
  • Dimensions: 235 x 155 mm
  • Languages: English

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